OHM+Fast-GT-S | Multi-sites Group Testing
OHM+Fast-GT-S | Multi-sites Group Testing-1
OHM+Fast-GT-S | Multi-sites Group Testing-2
- The best alternative for semiconductor testing system in mass production
- To build a complete ATE, suitable for RF, mixed signal, MEMS semiconductor devices.
- To provide modular software libraries to develop, debug, and deploy testing programs quickly
- To assist in customizing STS configurations, testing programs and load boards to integrate with the existing testing production lines.
- To improve efficiency, save field space, and reduce production cost
